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Quality Assurance

Our production capabilities, together with in-house quality control and a metrology laboratory let us offer top-notch quality and repeatability for each product we ship.

Our goal is to ensure that after fabrication, every element passes the final steps of quality testing, such as those relating to shape, surface quality, surface figure, dimension tolerances, parallelism, and spectral characteristics.

We believe that quality control is the most important aspect of all steps in the production of optical components, whether the component is used in a simple optical or complex industrial system. Altechna cares about your success in experiments, the performance of products, and excellence in quality.

In partnership with Vilnius University and local R&D companies we perform the following test procedures:
  • Laser-Induced Damage Threshold (LIDT) measurements according to ISO 21254-1-2, -3 and -4 standards for a wide range of laser wavelengths
  • Optical absorption tests according to ISO 11551 standard
  • Total scattering measurements according to ISO 13696
  • Transmittance and contrast AOI=0° from 4900 to 20000 nm
  • Surface roughness measurement with atomic force microscope

In-house Metrology

ZYGO Verifire XP/Z

Interferometer ZYGO Verifire XP/Z
  • Interferometric measurements for s and p polarization (Internal Zygo polarizator option). For polarization sensitive optics, such as laser crystals, waveplates and polarizers
  • Clear aperture up to 101.6 mm
  • Zygo transmission-/reference flats (< λ/20 @ 632.8 nm) for surface flatness (PV/power/irregularity/RMS), wavefront distortion and parallelism measurements
  • Zygo f/0.75, f/1.5, f/3.3, f/10.7 transmission/reference spheres
    (< λ/20 @ 632.8 nm) and “Renishaw” guide rail (1500 mm) for radius metrology to test spherical surfaces for form irregularities, wavefront distortion, and Radius of Curvature with the radius of ±4 nm – ±800 mm

Profilometer ZYGO ZeGage Pro HR

Profilometer ZYGO ZeGage Pro HR
  • White light interferometric microscope: Measures the topography of an optical or matte surface by the technique of non-contact 3D coherence scanning interferometry (CSI).
  • 10X Mirau objective with a 7.4 numerical aperture and a total field of view measuring 0.87×0.87 mm
  • Roughness measurement of plano, spherical, and cylindrical surfaces with stitching capabilities
  • Surface topography repeatability of ≤0.15 nm, with an RMS repeatability of 0.01 nm
  • Capability for sub-Angstrom (<1 Å) high-precision optical surface measurements
  • Measurement capacity for parts up to 100×100 mm with a height of 90 mm

Spectrophotometer Photon RT

Spectrophotometer Photon RT
  • Designed for measurement of optical samples
  • Spectral range within 185 nm – 3500 nm
  • Polarization measurements within 220 nm – 3500 nm
  • Transmittance: T, Ts, Tp for angles 0° – 75°
  • Absolute reflectance: R, Rs, Rp for angles 8° – 75°
  • Option for measurement of polarizing beam splitter cubes (Rs+Tp)

Spherometer with centering module

Spherometer with centering module
  • For spherical lens radius of curvature, focal length and centration measurements
  • For cylindrical radius of curvature within 185 – 3500 nm
  • Additional accessories extend our capabilities to measure EFL values up to ± 5000 mm, ROC – ± 750 mm
  • Non-contact and less damaging method
  • Accuracy: 0.05% – 0.3%

High accuracy goniometer

High accuracy goniometer
  • For testing prisms, polygons, wedges, deflection, roof-angle
  • Absolute testing of polygons according to the rosette method
  • Evaluation of the measurement results in conformance to the
    ISO 10110-1, VDI-2605 as well as the DIN 3140 standards
  • Air bearing rotary table. Accuracy better than 0.6 arcsec
  • Minimum specimen surface (uncoated glass) – 0.5 mm²
  • Maximum specimen diameter – 210 mm

Starrett AVR300

Automatic CNC vision metrology system with Renishaw touch probe kit
  • Dedicated for very accurate and repetitive dimensions measurement
    for optical and mechanical components
  • Full CNC X-Y-Z motorized positioning: 300 x 200 x 200 mm
  • Accuracy: 1.9 μm + 5L/1000 for X and Y, 3.5 μm + 5L/1000 for Z
  • Video edge detection (VED)
  • 2D geometrical constructs plus height
  • Field-of-view (FOV) measurements integrated with stage motion, from
    12 mm to 1 mm
  • Telecentric 12:1 Zoom lens (total magnification: 26x-310x)
  • Touch probe: Renishaw PH6 head with TP20SF 6-way, kinematic touch-trigger probe system
  • Reports in CSV, TXT, PDF or DXF file format

Temperature and humidity chamber

Temperature and humidity chamber
  • For coatings, glued parts and materials tests
  • Static and dynamic environmental tests according to MIL-PRF-13830B, MIL-C-48497A, and other durability requirements
  • Temperature range from -50 °C to +155 °C. Stability ± 0.5 °C
  • Relative humidity range is 30% – 95%
  • 22.5 L capacity
  • Samples up to 290 x 250 x 240 mm (W x H x D)

Chromatis (KMLabs)

Dispersion measurement instrument – “Chromatis”
  • Measurements of components and coatings phase (rad) / Group delay (fs) / GDD (fs²) / TOD (fs³) / FOD (fs4)
  • Spectrum range: 550 – 1650 nm. Resolution up to 5 fs²
  • Measurements for s and p polarization simultaneously in reflection and transmission modes
  • Angles of incidence from 0° to 70°
  • Mirror pairs are measured at angles from 6° to 54°
  • The white light source allows characterization of mirrors designed for Ti:sapphire (800 nm), Yb:fiber (1030 nm), and Er:fiber (1550 nm)

Custom measurement setups

Custom measurement setups
  • According to customer inquiries, we build customized setups to test certain parameters such as retardation, extinction ratio, beam displacement, polarizers contrast, pointing stability, transmitted beam distortion, beam quality, etc.
  • CW laser wavelengths: 460 nm, 520 nm, 532 nm, 632 nm, 660 nm, 808 nm, 1030 nm, 1064 nm, 1531 nm, 1550 nm
  • Pulsed laser wavelengths: 355 nm, 532 nm, 1064 nm
  • Cavity Ring Down (CRD) setup for 355, 532, 1064 nm wavelengths
  • Custom polarimetric setup for Stokes parameters measurement
  • Shack-Hartmann setup for assemblies wavefront testing
  • Autocollimator setup for complex beam deviation and angle measurements

Surface quality inspection

Surface quality inspection
  • Visual inspection methods according to MIL-PRF-13830B, ISO 10110-7, ISO 14997:2011 or another strict requirement according to the customer
  • Equipment for visual inspection workplace:
    • Stereo Olympus SZX7 microscope – with CCD camera for photos and dimensions measurement and 0.6 -11.2X magnification
    • High power light source (MLC-150C, Motic)
    • Standard illumination – 120 000 Lx
    • Horizontal laminar flow cabinet
  • Other equipment:
    • Analytical microscopes Olympus BX51TRF, Nikon C-PSN
    • ISO 10110-7 / ISO 14997 Plus – Surface scratch & dig evaluation targets
    • Certified abrasion and adhesion test kit (CAT.S12900)