Laser interferometry is used for ultra-precise dimensional measurements and calibration, outperforming traditional methods by providing nanometer-level accuracy. These systems typically operate at visible or near-infrared wavelengths (e.g., 532 nm or 633 nm) and often use continuous-wave (CW) lasers for stable interference patterns. Critical optical components include beam splitters, high-quality mirrors, and precision lenses to maintain coherence and minimize phase errors.
Optical Metrology
Photonics-based metrology systems enable precise, non-contact measurement and inspection across industries, ensuring dimensional accuracy, surface quality, and process control.
Unlike conventional mechanical gauges, optical metrology offers high resolution, speed, and flexibility for complex geometries and delicate materials.
These systems rely on advanced optics to deliver stable, distortion-free imaging and accurate light manipulation, which is critical for achieving repeatable and traceable measurements.
Altechna supplies precision optical components and assemblies engineered to maintain exceptional beam quality and stability, ensuring optimal performance in demanding laser metrology systems.
Laser Metrology Systems
Engineered for metrology systems
Laser Interferometry Systems
3D Optical Scanning Systems
3D scanning systems enable rapid, non-contact measurement of complex surfaces and parts, offering speed and flexibility compared to tactile probes. They commonly use structured light or laser triangulation at visible wavelengths (e.g., 450–650 nm) and rely on CW or modulated beams for accurate depth mapping. Essential optics include projection lenses, scanning mirrors, and anti-reflective coated windows for high-resolution imaging.
Surface Profilometry Systems
Optical profilometers measure surface roughness and texture without damaging the sample, delivering superior resolution compared to mechanical stylus methods. These systems often use white light or near-infrared sources (400–1000 nm) and operate in CW mode for continuous scanning. Key optical components include objective lenses, interferometric beam splitters, and precision filters to ensure accurate phase and amplitude control.
criteria
Critical performance criteria
Spectral Accuracy
Optics must maintain precise wavelength control to ensure measurement traceability and minimize chromatic errors.
High Stability and Alignment
Mechanical and thermal stability is critical to maintain calibration and repeatability under varying environmental conditions.
Exceptional Surface Quality
Defect-free and low surface roughness (<0.1 nm RMS) optical surfaces are essential for accurate imaging and interference, preventing scatter and distortion.
Low Wavefront Distortion
Optical components must preserve wavefront integrity for interferometric accuracy and high-resolution imaging.
Solutions
Our solution tailored for metrology application
Ultra-fine mirrors & beam splitters
Substrate materials
FS, BK7
Substrate size range
4-170 dia. mm
Substrate thickness
2-20 mm
Substrate geometry
round, rectangular, prism, lens
Spectral range
400 – 3500 nm
Spectral performance
R>99.95%, T<0.01% @633 nm AOI0/45°
up to ±0.02% spectral tolerance for beam splitters @633 nm AOI0/45°
Coated optic surface roughness (RMS)
<0.1 nm
WFD
<L/10 @633 nm
